Measurement using an evanescent mode of an open coaxial resonato f a sample material is placed on the probed,an evanescent electrical ield leaks from the probe tip into the sample material his electrical field changes with the dielectric properties of th aterial,which in turn changes the resonant frequency and the Q factor o he whole cavity. The dielectric properties are then calculated from the change esonance.
Simple,accurate and non-destructive measurement n open resonator enables the easy placement of the sample nd a fast,accurate measurement of its dielectric properties.
Stable measuremen firm contact between sample and probe is obtained with a vacuum attachment.
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