TE mode Cavity Resonator (thin film)


This measurement method is specifically designed for thin-film measurements.

This type of resonant cavity is also known as a split-cylinder resonator.

 

During measurement, the thin-sheet sample is inserted into the gap between the two resonant cavities. This method supports frequencies up to 60 GHz, making it suitable for 5G (fifth-generation mobile communication systems) applications.

 

Our TE-mode resonant cavity features a fixed sample insertion gap, providing better measurement stability compared to other products.
It can measure a wide range of materials, including both soft and brittle samples.

Frequency range: 10 GHz – 60 GHz
Frequency points: 1 frequency point per resonator
Measurement range:

  • εr (Dk): 1 – 5

  • tanδ (Df): 0.01 – 0.0001

Measurement accuracy:

  • εr (Dk): ±1%

  • tanδ (Df): ±5%

Sample shape: Thin sheets (thickness < 0.3 mm)

Standards compliance: JIS R1641, IPC-TM-650 2.5.5.13

5G materials, flexible substrates, etc.

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