HMS-3000
Entry-Level Hall Measurement
1. High Precision & Reproducibility
- Stable and accurate measurement of carrier concentration, mobility, resistivity, and Hall coefficient with low electrical noise.
2. Compact & Easy to Use
- Small desktop system with permanent magnet for magnetic flux input and low-temperature testing down to 77 K.
3. Flexible Sample Testing
- Supports a wide range of sample sizes: 5 × 5 mm to 30 × 30 mm, up to 5.5 mm thick.
4. Graphical Analysis
- Automatically plots I-V and I-R curves for checking Ohmic contact quality and basic electrical characteristics.
5. Comprehensive Test Results
- Instant calculation of bulk & sheet carrier concentration, mobility, resistivity, conductivity, Hall coefficient, magnetoresistance, and Alpha ratio.
The HMS-3000 is a complete Hall effect measurement system used to characterize semiconductor samples. It measures carrier concentration, mobility, resistivity, and the Hall coefficient, and also determines whether the sample is an N-type or P-type semiconductor.
-
Main unit dimensions: approximately 32 × 30 × 10.5 cm (W × D × H), weight about 7.7 kg.
-
DC input current range: 1 nA to 20 mA.
-
Measurable resistivity: 10⁻⁴ to 10⁷ Ω·cm.
-
Measurable carrier concentration: approximately 10⁷ to 10²¹ /cm³.
-
Measurable mobility: approximately 1 to 10⁷ cm²/V·s.
Suitable for a wide range of semiconductor materials such as Si, GaAs, InP, GaN, as well as conductive or transparent conductive films such as ITO and ZnO.
